Event
ISS Surface & Materials Characterization Workshop
Tuesday, May 19, 2015 09:00toWednesday, May 20, 2015 17:00
Wong Building
3610 University Street, 3610 rue University, Montreal, QC, H3A 0C5, CA
Price:
Free for ISS Students; $280 plus Taxes for Others
Instructors
Main Instructor: Prof. Pierre-Luc Girard-Lauriault, Department of Chemical Engineering
Co-Instructors: Prof. Raynald Gauvin and Prof. Marta Cerruti, Department of Mining and Materials Engineering
Instructor Biography: Prof. Girard-Lauriault is part of the Plasma Processing Laboratory and conducts research on the development of plasma prepared thin organic coatings aimed at biomedical applications.Ìý During both his doctoral, at École Polytechnique, in Montreal (Canada), and post-doctoral, at the federal institute for materials research and testing, in Berlin (Germany) studies he has used and developed an array of surface analysis techniques to understand the chemistry and morphology of complex plasma polymer surfaces as well as their influences on the interactions with living cells.
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Workshop Schedule
The workshop aims at providing the participants with a sufficient understanding of the principles of surface characterization in order for them to be able to prepare a tailored characterization strategy to answer their own research questions. It is divided in two parts:
First, a lecture (4h) that will cover the following points:
- An overview of the field of Surface Characterization and a description of its basic principles and considerations.
- A presentation and comparison of the main surface characterization techniques by focusing on i) technique working principles ii) information obtained iii) important practical experimental considerations iv) usefulness for sensor technologies.
- A more detail presentation of X-Ray Photoelectron Spectroscopy (XPS), Scanning Electron Microscopy (SEM) and Raman Spectroscopy.
Following the lecture, the participants will take part in a practical workshop (1.5 days) where several surface characterization techniques (X-Ray Photoelectron Spectroscopy, Scanning Electron Microscopy, Raman spectroscopy, Surface Plasmon Resonance Spectroscopy and Confocal Microscopy) will be used to analyze relevant samples.
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Workshop Summary
Sensor technologies are often based on physical or chemical processes that occur at a surface/interface.Ìý The capacity to characterize and understand the surface properties of materials is therefore a critical success parameter for the development or refinement of a particular sensor application.Ìý The surface is an elusive entity defined by the first atomic layers of a material, which are generally different than those in the bulk material underneath.Ìý The selective analysis of this thin layer of material is a significant challenge, which defines its own field: Surface and Interface Analysis, a combination of principles, techniques and strategies which allow the gathering of information about the surface of materials.
Space is limited, therefore ISS graduate students and undergraduates will have priority.Ìý Free spots will be allotted on a first come first serve basis, and all non ISS students will be added to the waitlist.
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Cost and Registration
Deadline to register: May 15, 2015
The cost of the workshop is $280.00 plus taxes.Ìý For all ISS participants who register and show up, the fee will be waived. Cancellations should made at least 24 hours in advance or the participant will be charged the full cost of the workshop. Spots will be allotted on a first come first serve basis.
To register, click here